SP203P USB 2048x1536 CMOS 1440-1605 nm Laser Beam Profiler with BeamGage Software

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Overview

The SP203P camera, equipped with a Phosphorus coated sensor designated for SWIR wavelengths of 1440 to 1605 nm and especially the popular 1550nm. Operating with the BeamGage Software it provides an affordable solution for SWIR measurement.

2048 x 1536 pixels with a with a 60 µm pitch
24 fps at full resolution
BeamGage Standard or Professional software included
Requires Win 10, (64 bit) or Win 11

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Products

		Compare	Model	Compatibility	sortOrder	rankScore	ranking	Drawings, CAD & Specs		Spectral Range	Beam Size	Sensor Type	Elements	Availability	Featured Item	Price		Brand
		SP90636 BGS-USB3-SP203P SP203P Laser Beam Profiler, 2048x1536 px, 24 fps, 1440-1605 nm, USB 3.0, BeamGage Standard Contact Us	SP90636 BGS-USB3-SP203P SP203P Laser Beam Profiler, 2048x1536 px, 24 fps, 1440-1605 nm, USB 3.0, BeamGage Standard	UNIVERSAL	0.0	1.0	0.0		0.0	1440-1605 nm	0.6 to 5.3 mm	Phosphor-Coated Silicon CMOS	2048 x 1536	Contact Us				Ophir
		SP90637 BGP-USB3-SP203P SP203P Laser Beam Profiler, 2048x1536 px, 24 fps, 1440-1605 nm, USB 3.0, BeamGage Standard Contact Us	SP90637 BGP-USB3-SP203P SP203P Laser Beam Profiler, 2048x1536 px, 24 fps, 1440-1605 nm, USB 3.0, BeamGage Standard	UNIVERSAL	0.0	1.0	0.0		0.0	1440-1605 nm	0.6 to 5.3 mm	Phosphor-Coated Silicon CMOS	2048 x 1536	Contact Us				Ophir

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BeamGage Standard

BeamGage Standard is our full-function software with an extensive set of ISO quantitative measurement, our patented UtraCal™ algorithm for the highest accuracy measurements in the industry.

BeamGage Professional

BeamGage Professional has all of the functionality that BeamGage Standard includes. BeamGage Professional supports all of our beam profiling cameras, includes window partitioning to allow analysis of multiple beams on a single camera, and includes an automation interface written in .NET to push data to your custom applications.

Specifications

Product Name

SP203P
Spectral Range

1440-1605 nm
Beam Size

0.6 to 5.3 mm
Communication Interface

USB 3.0
Sensor Type

Phosphor-Coated Silicon CMOS
Compatible Light Sources

CW, Pulsed
Active Area

5.3 X 7.1 mm
CCD Recess

4.5mm

Elements

2048 x 1536
Effective Pixel Pitch

60 µm
Dynamic Range

32 dB
Full Resolution Frame Rate

24 fps
Saturation Intensity

200W/cm2 at 1550nm
CE Compliance

Yes
UKCA Compliance

Yes
China RoHS Compliance

Yes

Features

BeamGage^® Laser Profiling Software

BeamGage^® comes in two versions: Standard and Professional. Each builds off of the next adding additional capability and flexibility as needed for adapting to almost any configuration requirement. The software performs rigorous data analyses on the same parameters, in accordance with the ISO standards, providing quantitative measurement of numerous beam spatial characteristics. Pass/Fail limit analysis for each of these parameters can be also applied.

BeamGage^® Software Measurements

ISO Standard Beam Parameters
Dslit, Denergy, D4σ
Centroid and Peak location
Major and Minor Axis
Ellipticity, Eccentricity
Beam Rotation
Gaussian Fit
Flat-top analysis / Uniformity
Divergence
Pointing stability

Laser Beam Profiler Accessories

When performing beam profiling measurements on a laser, it is sometimes necessary to manipulate the beam in order to achieve a signal that is suitable to be measured. Occasionally, the beam needs to be sized correctly by either increasing it if it is too small, or increasing it if it is too large. Often times, the laser’s power needs to be reduced to a certain level to be imaged. Our laser beam profiler accessories allow you to achieve proper beam sizes and power levels so that you can achieve the most accurate measurements possible.

Designing Laser Beam with BeamMaker

BeamMaker helps engineers, technicians, and researchers understand a beam's modal content by creating a theoretically generated beam. Design your perfect beam profile in BeamMaker by specifying the mode, size, width, height, intensity, angle, and noise content - then configure your laser to run the as designed, and compare your actual beam to the theoretically derived measurements. The end result is knowledge about how much the real beam varies from the desired beam.

Fundamentals of Laser Measurement & Beam Profiling

Is your laser's beam profile shaped correctly for your application? This video teaches the fundamentals of laser beam profiles and discusses the benefits of profiling your laser beam. Several case studies are presented showing before and after laser beam profiles.

Measuring Laser Focus Spot Size in an industrial Medical Device Application

This step-by-step tutorial will show you how to set up a camera-based beam profiling system on an industrial single-pulse laser welding system. It will also demonstrate for you how to simultaneously analyze the laser's focused spot, measure the laser's energy per pulse, and measure its temporal pulse shape.

Frequently Asked Questions

Regarding dead or bad pixels in the imager array: Will my camera have any bad pixels, do they affect my laser profile measurement, and can they be corrected and how? can they be corrected and how?

Answer

Camera Defects Policy
Ophir-Spiricon, LLC (OSL) is a supplier of laser beam analysis tools that employ commercial-industrial solid-state cameras. OSL attempts to supply cameras with as few pixel defects as possible. OSL tests for and corrects defective pixels that may have an adverse effect when used for its intended purpose. OSL does not guarantee that a supplied camera will be defect free, or that they will remain defect free during its normal lifetime and under normal use.

It is not uncommon for modern megapixel camera imagers to develop point defects as they age, even when not subjected to abuse. Imagers without windows often experience point defects at rates typically greater than imagers with their cover glass left in place. Point defects can also appear more frequently when operating at higher rather than lower ambient temperatures, and higher relative humidity. Such defects can occur even when the camera is in storage and not being used.

Cameras supplied by OSL will be certified for use in laser beam analyzer applications. When defects occur, the ability to make certain measurements under certain conditions may be compromised. However, depending upon the nature of the defect, most measurement can still be performed without loss of accuracy. In some instances the effects of defects can be eliminated or significantly reduced by adjusting the manner in which the camera is being employed.

Ophir-Spiricon, LLC offers a camera recertification service. This service can help to extend the useful life of your camera and correct some point defects that may show up over time. This service can not correct cameras with serious laser damage or imager degradation. Whenever possible OSL will restore the camera to our "as new" level of certification; and if not possible, we will indicate to the user how to avoid areas of the imager that may not perform to "as new" standards.

Defects, Solutions and Workarounds
The following list contains examples of typical camera point defects that may occur over time, and suggested methods of compensating for them if they are troublesome:

Defect type	Description of the Problem	Recommended Solution See Note 1 below
Bright Pixel	Pixels with this defect will indicate being illuminated even when no signal is present. These are the most troublesome when attempting to make accurate peak fluence and peak fluence location measurements because they represent a false signal. Most other measurements are not adversely affected by this type of defect. This type of defect is screened for during our regular camera inspection process. All pixels that exceed a set limit are corrected, if possible, before the camera ships. See Note 1 below. Our QA department will often reject cameras if the pixel can not be corrected and it exceeds our acceptance criteria.	Ultracal/baseline correction will subtract out the defective pixel. Reposition the camera to remove the defective pixel from the measurement region and employ a manual aperture to isolate the pixel from the area of interest. Return the camera to OSL to have the bad pixel corrected and the camera re-certified.
Twinkling Pixel	This is an intermittent version of the Bright Pixel defect. These often appear as the camera warms up. May disappear if the camera is run in cooler environments. Usually predicts a pixel that will soon be a permanently bright pixel defect. These are the hardest to detect and as such may get past our camera inspection process.	Same as above. If returned to OSL to be corrected please send a full frame data file showing the pixel as it is malfunctioning. This will aid in our ability to find and fix it.
Dark Pixel	Dark pixels have low responses compared to the amount of illumination that they receive. Isolated instances of these types of defects do not pose a serious beam analysis problem and they are generally not in need of correcting.	This type of defect will not significantly impact a beam measurement result unless the beam is very very small and the defect falls inside of the beam profile. Reposition the camera to remove the defective pixel from the measurement region.
Dead Pixel	Dead pixels have no response at all and may output a raw pixel value of zero (0) counts. This type of defect is screened for during our regular camera inspection process. All pixels that exceed a set limit are corrected, if possible, before the camera ships.	This type of pixel may create a warning message when performing Ultracal operations. Ignore the warning and proceed as in the Dark Pixel case described above.
Dark Clusters	These dimmer than normal clusters involving about a dozen or fewer pixels are often caused by dust particles and can usually be removed by cleaning of the imager. Sometimes these can be very difficult to impossible to remove. In the latter case they are may be melted into imager If this is the result of laser damage then imager replacement is the only solution.	These usually do not cause serious measurement problems and can be treated with the Dark Pixel workaround described above. They can sometimes be dislodged with very gentle puffs of dry air. If you return a camera to be re-certified we have a few special methods for cleaning these, but success is not 100% guaranteed.
Regions of non-uniform response	When large areas of an imager yield reduced signal levels this usually indicates laser damage. Long term exposure to ultraviolet radiation or overexposure to high laser power or peak energies are common causes.	This type of degradation is not repairable and either the camera or the camera imager must be replaced.

Note 1: The following camera models can be re-certified and can have bad pixels corrected:
GRAS20, SP620, L11058, L230, Pyrocam III, Xeva
Each of the above cameras will have a maximum number of pixels that can be corrected. Once this limit is exceeded the camera imager or the camera must be replaced in order to meet OSL "as new" certification standards. If a large cluster of defective pixels appear, then bad pixel correction may not be able to repair the defect. The following cameras do not have, or have very limited, bad pixel correction capabilities:
SCOR20, SP503, FX50, FX33, FX33HD

How come I can't use the Cameras Region Of Interest (ROI) Feature in my SP503U or SP620U Camera?
Answer
The initial release of the SP503U and SP620U cameras did not have the ROI feature enabled. Those cameras that do not have the ROI feature enabled will need to be returned for upgrading both hardware and firmware, and the latest version of software will need to be installed, which is available at;
https://www.ophiropt.com/laser-measurement-instruments/beam-profilers/services/software-download

Frequently Asked Questions

Regarding dead or bad pixels in the imager array: Will my camera have any bad pixels, do they affect my laser profile measurement, and can they be corrected and how? can they be corrected and how?

Answer

Defect type	Description of the Problem	Recommended Solution See Note 1 below
Bright Pixel	Pixels with this defect will indicate being illuminated even when no signal is present. These are the most troublesome when attempting to make accurate peak fluence and peak fluence location measurements because they represent a false signal. Most other measurements are not adversely affected by this type of defect. This type of defect is screened for during our regular camera inspection process. All pixels that exceed a set limit are corrected, if possible, before the camera ships. See Note 1 below. Our QA department will often reject cameras if the pixel can not be corrected and it exceeds our acceptance criteria.	Ultracal/baseline correction will subtract out the defective pixel. Reposition the camera to remove the defective pixel from the measurement region and employ a manual aperture to isolate the pixel from the area of interest. Return the camera to OSL to have the bad pixel corrected and the camera re-certified.
Twinkling Pixel	This is an intermittent version of the Bright Pixel defect. These often appear as the camera warms up. May disappear if the camera is run in cooler environments. Usually predicts a pixel that will soon be a permanently bright pixel defect. These are the hardest to detect and as such may get past our camera inspection process.	Same as above. If returned to OSL to be corrected please send a full frame data file showing the pixel as it is malfunctioning. This will aid in our ability to find and fix it.
Dark Pixel	Dark pixels have low responses compared to the amount of illumination that they receive. Isolated instances of these types of defects do not pose a serious beam analysis problem and they are generally not in need of correcting.	This type of defect will not significantly impact a beam measurement result unless the beam is very very small and the defect falls inside of the beam profile. Reposition the camera to remove the defective pixel from the measurement region.
Dead Pixel	Dead pixels have no response at all and may output a raw pixel value of zero (0) counts. This type of defect is screened for during our regular camera inspection process. All pixels that exceed a set limit are corrected, if possible, before the camera ships.	This type of pixel may create a warning message when performing Ultracal operations. Ignore the warning and proceed as in the Dark Pixel case described above.
Dark Clusters	These dimmer than normal clusters involving about a dozen or fewer pixels are often caused by dust particles and can usually be removed by cleaning of the imager. Sometimes these can be very difficult to impossible to remove. In the latter case they are may be melted into imager If this is the result of laser damage then imager replacement is the only solution.	These usually do not cause serious measurement problems and can be treated with the Dark Pixel workaround described above. They can sometimes be dislodged with very gentle puffs of dry air. If you return a camera to be re-certified we have a few special methods for cleaning these, but success is not 100% guaranteed.
Regions of non-uniform response	When large areas of an imager yield reduced signal levels this usually indicates laser damage. Long term exposure to ultraviolet radiation or overexposure to high laser power or peak energies are common causes.	This type of degradation is not repairable and either the camera or the camera imager must be replaced.

How come I can't use the Cameras Region Of Interest (ROI) Feature in my SP503U or SP620U Camera?
Answer
The initial release of the SP503U and SP620U cameras did not have the ROI feature enabled. Those cameras that do not have the ROI feature enabled will need to be returned for upgrading both hardware and firmware, and the latest version of software will need to be installed, which is available at;
https://www.ophiropt.com/laser-measurement-instruments/beam-profilers/services/software-download

Accessories

Description	Compatibility
Camera Trigger Optical Sensor	UNIVERSAL	Learn More
Neutral Density C-Mount Filters	UNIVERSAL	Learn More
LBS-300s Beam Splitter for Laser Beam Profilers	UNIVERSAL	Learn More
4X Beam Expander for Beam Profilers	UNIVERSAL	Learn More
Stackable Prism Front-Surface Beam Samplers	UNIVERSAL	Learn More
Stackable Wedge Beam Splitters	UNIVERSAL	Learn More
Beam Tap I & II Dual Surface Reflectors	UNIVERSAL	Learn More