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Catalogs
Catalog
Laser Power & Energy Measurement and Laser Beam Analysis Catalog
Details on all of our laser measurement instruments.
Catalog
Laser Beam Profilers Catalog
A laser beam profiler will increase your chance of success anytime you wish to design or apply a laser or when you find your laser system is no longer meeting specifications. You would ...
Technical Article
Three Tips to Protect Your BeamSquared Device
Here are three tips how to ensure precise measurement with your Ophir BeamSquared system over years.
Technical Article
Rayleigh Scatter, and Adhering to ISO 11146
This document is intended to show how the process of obtaining data and providing measurements using Ophir-Spiricon’s Rayleigh-scatter beam profiling technology, BeamWatch®, aligns ...
Technical Article
Overcoming the Challenges of Measuring High Power NIR Lasers
High power laser application has significantly increased in recent years due to new production techniques that enable cheaper manufacturing and operating costs. Applications of high-power ...
Technical Article
Quality Assurance in Additive Manufacturing
Whether in research or in production, the laser parameters must be checked regularly. For this purpose, Fraunhofer IAPT generally turns to the Ophir BeamWatch AM, which measures the ...
Technical Article
SLM Troubleshooting Made Easy with BeamWatch® AM
When we developed BeamWatch AM, we not only drew diagrams and thought about great features, we also talked to experienced manufacturers of selective laser melting (SLM) machines about ...
Technical Article
What to Expect in a Laser Profiling Demonstration
You may be wondering what to expect when you ask us for a laser beam profiling demo. Here's how it works.
Technical Article
Sensor Fusion Enables Comprehensive Analysis of Laser Processing in Additive Manufacturing
Successful outcomes require the power density distribution of the laser beam, as it is delivered to the work, to be symmetrical, uniform, and stable.
Technical Article
Reducing Production Waste with Laser Profiling
A laser profiling system can be of great benefit in helping to characterize and identify which variables affect product quality and waste minimization.
Technical Note
Total Optical Path Length with Beam Splitters on 4.5 mm Recessed CCD Cameras
Often we get requests for the Total Optical Path Length when beam splitters are used on our line of 4.5 mm recessed CCD cameras.
Technical Note
“What’s This” function in BeamGage 6.8
Problem: The “What’s This” feature only opens to the first page of the manual in Adobe Ready XI. Solution: Open your Adobe Reader XI
Technical Note
Using the built in photodiode trigger on the SP620U and SP503U cameras
With the introduction of BeamGage the capability of using the built in photodiode trigger in the SP camera series is now available.
Technical Article
University Research Team Faces Challenges of Measuring Multiple Lasers
The scientific community is often faced with the requirement of testing, validating, or merely qualifying several laser sources planned for a particular project.
Technical Article
Reimaging UV Laser Beam Profiling
Ophir Photonics offers a number of solutions for profiling UV laser beams. Spot sizes from 0.15 mm to over 25 mm can be safely profiled without the risk of camera sensor damage or ...
Technical Article
Overcoming Barriers to Industrial Laser Performance Measurement
During the development of these laser systems and installation in the applications in which they will be put into service, performance measurements of the components and the system ...
Technical Article
Technology’s Role in the Evolution from Laser Technician to Laser Technology Specialist
The skills required to understand, troubleshoot, and correct problems with lasers, and the systems they are a part of, are in high demand. It's all part of an evolution whereby yesterday's ...
Technical Article
Scanning Slit vs Camera-Based Beam Analyzers
In part 1, we discussed camera technologies that are available for covering various wavelengths. There are similar options for scanning slit profilers.
Technical Note
Outputting Data from Photon Instruments
We are frequently asked how one can output data from the NanoScan to other programs for additional analysis or publication. Depending nature of the desired end results there can be ...
Technical Note
Selecting the Correct Lens for M² Measurements with NanoModeScan
With the broad range of wavelengths that can be measured with this instrument, the first consideration is the material and anti-reflective coating of the lens. There are a number of ...
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