Catalogs

Details on all of our laser measurement instruments.

A laser beam profiler will increase your chance of success anytime you wish to design or apply a laser or when you find your laser system is no longer meeting specifications. You would ...

Ophir provides mutual interconnections between different Ophir products via adapters with various threads, designed to exactly fit required optical path distances for each device.

Here are three tips how to ensure precise measurement with your Ophir BeamSquared system over years.

This document is intended to show how the process of obtaining data and providing measurements using Ophir-Spiricon’s Rayleigh-scatter beam profiling technology, BeamWatch®, aligns ...

High power laser application has significantly increased in recent years due to new production techniques that enable cheaper manufacturing and operating costs. Applications of high-power ...

Whether in research or in production, the laser parameters must be checked regularly. For this purpose, Fraunhofer IAPT generally turns to the Ophir BeamWatch AM, which measures the ...

A laser profiling system can be of great benefit in helping to characterize and identify which variables affect product quality and waste minimization.

Often we get requests for the Total Optical Path Length when beam splitters are used on our line of 4.5 mm recessed CCD cameras.

The scientific community is often faced with the requirement of testing, validating, or merely qualifying several laser sources planned for a particular project.

Ophir Photonics offers a number of solutions for profiling UV laser beams. Spot sizes from 0.15 mm to over 25 mm can be safely profiled without the risk of camera sensor damage or ...

A developer of power-bed additive manufacturing systems needed a beam profiling system that could be used by their field technicians for setup and maintenance of customers’ lasers.

The center of the NanoScan can be found by the following steps.

BeamGage has the ability to lock out the ability to make changes to the settings in case you inadvertently change something you shouldn't have, or if you want to lock out operators ...

In part 1, we discussed camera technologies that are available for covering various wavelengths. There are similar options for scanning slit profilers.

The NanoScan slit and pinhole aperture substrates are very thin and extremely fragile. Any physical contact will likely damage them. For example, fiber tips placed too close to the ...

We do not recommend using the smallest scan heads (3.5 mm aperture, 1.8 μm slit) for M2 measurement, because they are subject to a distortion effect called vignetting: Scanning slits ...

The Focal Length Divergence measurement method is based upon the beam width of a focused beam’s spot size and the focal length of the focusing optic.

Image logging and export formats in BeamGage are intended for use as easily created screenshots for reports and presentations. Alternatively there are real data formats for use in mathematical ...

The Partition feature, available in BeamGage Professional, allows subdividing the camera imager into separate regions, called partitions, and which can then compute separate beam results ...