The NS2s-Si/3.5/1.8-PRO scanning-slit profiling system (P/N PH00464) with 3.5 mm aperture accurately captures and analyzes wavelengths from 190 to 1100 nm with its Silicon detector. It features a 1.8 µm slit size suitable for small beams, near real-time data capture rates, an optional power measurement feature, and operates in CW or kHz Pulsed modes which makes it ideal for comprehensive laser analysis. NanoScan Pro software is included.