The NS2s-Ge/3.5/1.8-STD scanning-slit profiling system (P/N PH00459) with 3.5 mm aperture accurately captures and analyzes wavelengths from 700 to 1800 nm with its Germanium detector. It features a 1.8 µm slit size suitable for small beams, near real-time data capture rates, an optional power measurement feature, and operates in CW or kHz Pulsed modes which makes it ideal for comprehensive laser analysis. NanoScan Standard software is included.